Research Facilities


Cascade Microtech S300 12" Semiconductor Probestation

This probe station is one of two of its kind in the UK. It is fitted with ‘AttoGuard’ technology which permits the measurement of extremely low leakage currents over the entire wafer surface. The prober is fully automatic and has been interfaced to a semiconductor parameter analyser with preamplifiers capable of current measurement in the femtoamp range.

Hesse and Knipps Bondjet 710 wire bonder

Our wire bonder is a fully automatic wedge to wedge wire bonder. It has a comprehensive suite of parameter measurement and analysis tools that records the strength and bondquality for each bond as it is laid down by the machine. This machine was used to bond three hundred modules during the ATLAS SCT production in Glasgow, laying down over 1.5 Million bonds in the process. It is also used for bonding devices for our other research projects and for external work.

Disco DAD 321 Automatic Dicing Saw

 

This is a fully programmable dicing saw for the precision dicing of wafers up to 100 mm in diameter.  It is used to dice objects from silicon, GaAs and glass for different research projects that the group is involved in.

Fabrication Facilities

The Experimental Particle Physics group utilise micro and nano-fabrication technology to make many of their devices. Some of the fabrication work is carried out using the equipment located in the James Watt Nano-Fabrication Centre. Devices are patterned using either a Karl Suss MA6 mask aligner, an EBPG 5HR 100, or a VB6 UHR EWF electron beam lithography tool. Some of the other pieces of equipment used include Dry Etch machines, Plassys metallisation equipment, Hitachi scanning electron microscopes, and Veeco metrology equipment.

Optical surface profiler


The Wyko NT1100 Optical surface profiler from Veeco is a metrology system using non-contact interferometry to measure surface features. The system has two measurement modes:
Vertical shift interferometry (VSI): this uses white light and is used for measuring features in the range 140 nm to several mm
Phase shift interferometry (PSI): utilising a filtered light source and a piezo electric phase shift - small features can be measured, from ~1 to 140 nm.

The system has an automated stitching stage for large area coverage. Measurements can be made on any reflective surface.


 

TM1000 SEM


The Hitachi TM1000 table top SEM is a self contained SEM. Able to take samples sizes 50 mm in diameter and up to a max of 20 mm height. The system has a pump down time of less than 5 minutes with a maximum magnification of x10k giving a resolution of ~30 nm. It also features a facility to image insulating surfaces using an air micro-bleed  to prevent charge buildup.

 

Olympus Nomarski DIC microscope


This microscope has the choice of reflected or transmitted light observation with a maximum magnification of 100x. The microscope has a range of features including

● Darkfield observation

● Polariser and analyser for stress observation

● Differential image contrast (DIC) measurement

● UV source for fluorescence of biological samples

● Olympus CELL DAQ software running off of a DP-70 12.5 Mpix digital camera

HAAS VM-2SE milling centre


HAAS VM-2SE fully automated 5-axis vertical milling centre for manufacturing large mechanical structures and small complex parts. Maximum table size 760x 610x 610 mm. The mill has high speed machining capabilities with the 4th and 5th axis fully integrated and controlled through dedicated post processor sofware. The tool is capable of milling to better than 10 micron precision over the entire machining volume.




For further information on any of the equipment here contact Val O’Shea /Liam Cunningham